Fig. 8From: Precise spectrophotometric method for semitransparent metallic thin-film index determination using interference enhancementTop: measured reflectance spectrum for Si/800 nm SiO2/28 nm Ti stack at near-normal incidence, and resulting fits for index dispersion of the Ti layer using simple and MD-FB models. Bottom: comparison between literature data for bulk Ti (dashed), and simple and MD-FB models for index dispersion of 28nm Ti layer (solid)Back to article page