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Fig. 1 | Journal of the European Optical Society-Rapid Publications

Fig. 1

From: Stimulated Raman scattering simulation for imaging optimization

Fig. 1

A measured beam profile at 1064 nm is shown in (a) to illustrate the result of one beam knife edge measurement in the lateral and the axial (depth) directions indicated by x and z, respectively. The dashed red line indicates the steepest slope, i.e. the focal plane depth. Derivatives of the measured data of the beam profiles at the focal plane are shown in (b) for the probe at 909 nm (red line) and the carrier at 1064 nm (blue line). Multiplying the fitted Gaussians of the two beams gives the SRS profile also shown in (b) (black line). Note: 1. One fourth of the data points are plotted for clarity. 2. SRS beam profile not to scale on the y-axis

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