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Table 1 Standard deviation for 100 simulated cases of n, k (both unitless) and d (nm) when using four different methods

From: Precise spectrophotometric method for semitransparent metallic thin-film index determination using interference enhancement

Configuration

Standard Deviation

 

n

k

d

OS near-normal incidence

0.015

0.0116

0.236

OS normal + oblique incidence

0.0095

0.0064

0.132

TS near-normal incidence

0.5365

0.0207

5.5

TS normal + oblique incidence

0.0212

0.0081

0.223