From: Precise spectrophotometric method for semitransparent metallic thin-film index determination using interference enhancement
Configuration
Standard Deviation
n
k
d
OS near-normal incidence
0.015
0.0116
0.236
OS normal + oblique incidence
0.0095
0.0064
0.132
TS near-normal incidence
0.5365
0.0207
5.5
TS normal + oblique incidence
0.0212
0.0081
0.223